{"id":4637,"date":"2024-12-23T19:56:26","date_gmt":"2024-12-23T15:56:26","guid":{"rendered":"https:\/\/iss-lab.com\/?page_id=4637"},"modified":"2024-12-23T19:56:27","modified_gmt":"2024-12-23T15:56:27","slug":"semiqcm-sr-sensors-for-precursor-monitoring","status":"publish","type":"page","link":"https:\/\/iss-lab.com\/index.php\/semiqcm-sr-sensors-for-precursor-monitoring\/","title":{"rendered":"SemiQCM\u2122 SR Sensors for Precursor Monitoring"},"content":{"rendered":"\n<p class=\"has-medium-font-size\"><strong>Making Excellence Repeatable<\/strong><\/p>\n\n\n\n<div class=\"wp-block-media-text has-media-on-the-right is-stacked-on-mobile\" style=\"grid-template-columns:auto 64%\"><div class=\"wp-block-media-text__content\">\n<p><\/p>\n<\/div><figure class=\"wp-block-media-text__media\"><img loading=\"lazy\" decoding=\"async\" width=\"500\" height=\"335\" src=\"https:\/\/iss-lab.com\/wp-content\/uploads\/2024\/12\/image-345.png\" alt=\"\" class=\"wp-image-4639 size-full\" srcset=\"https:\/\/iss-lab.com\/wp-content\/uploads\/2024\/12\/image-345.png 500w, https:\/\/iss-lab.com\/wp-content\/uploads\/2024\/12\/image-345-300x201.png 300w\" sizes=\"(max-width: 500px) 100vw, 500px\" \/><\/figure><\/div>\n\n\n\n<p><strong>Protect and Grow Your Profit with Precision Rate and Thickness Monitoring<\/strong><\/p>\n\n\n\n<p>The SemiQCM\u2122 SR sensor is one component of a system for precursor monitoring with the other components being an IMM-200 and FabGuard (version 19.12.00-a or higher).<\/p>\n\n\n\n<p>Semi Process Monitoring can be used in semiconductor applications for end point detection and fault elimination by monitoring the amount of precursor in the foreline or chamber exhaust. The use of an in situ QCM provides affordable process monitoring and improved semiconductor process profitability.<\/p>\n\n\n\n<p><strong>The failure to deliver precursor to a wafer can be detected in as little as one wafer.<\/strong><\/p>\n\n\n\n<h2 class=\"wp-block-heading\">Features<\/h2>\n\n\n\n<ul>\n<li>QCM data monitored at 10Hz<\/li>\n\n\n\n<li>FabGuard correlates QCM data to tool state and process step<\/li>\n\n\n\n<li>Precise measurement of deposition or etch rates<\/li>\n\n\n\n<li>Sensitivity &amp; precision for sub-monolayer thickness measurement<\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\">Advantages<\/h2>\n\n\n\n<ul>\n<li>Real-Time, in situ process monitoring<\/li>\n\n\n\n<li>Prevent over-etching, identify chamber clean end point<\/li>\n\n\n\n<li>Identify equipment or process state fault<\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\">Typical Applications<\/h2>\n\n\n\n<ul>\n<li class=\"has-medium-font-size\">Semiconductor Manufacturing<\/li>\n<\/ul>\n\n\n\n<h2 class=\"wp-block-heading\">Brochures &amp; Data Sheets<\/h2>\n\n\n\n<p class=\"has-medium-font-size\"><a href=\"https:\/\/www.inficon.com\/media\/3757\/download\/PDMAT-SemiQCM-Datasheet.pdf?v=1&amp;inline=true&amp;language=en\" target=\"_blank\" rel=\"noreferrer noopener\"><strong>PDMAT SemiQCM Datasheet<\/strong><\/a><\/p>\n\n\n\n<div class=\"wp-block-buttons alignwide is-content-justification-left is-layout-flex wp-container-core-buttons-is-layout-1 wp-block-buttons-is-layout-flex\">\n<div class=\"wp-block-button has-custom-width wp-block-button__width-25 is-style-outline\"><a class=\"wp-block-button__link wp-element-button\" href=\"https:\/\/www.inficon.com\/en\/products\/thin-film-technology\/semiqcm-sr-sensors-for-precursor-monitoring\" target=\"_blank\" rel=\"noreferrer noopener\"><strong><em>More Information<\/em><\/strong><\/a><\/div>\n\n\n\n<div class=\"wp-block-button is-style-outline\"><a class=\"wp-block-button__link wp-element-button\" href=\"https:\/\/iss-lab.com\/?page_id=4613\"><em><strong>Thin Film Deposition Monitors<\/strong> <strong>Page<\/strong><\/em><\/a><\/div>\n\n\n\n<div class=\"wp-block-button is-style-outline\"><a class=\"wp-block-button__link wp-element-button\" href=\"https:\/\/iss-lab.com\/?page_id=4573\" target=\"_blank\" rel=\"noreferrer noopener\"><strong><em>Thin Film Technology Page<\/em><\/strong><\/a><\/div>\n\n\n\n<div class=\"wp-block-button is-style-outline\"><a class=\"wp-block-button__link wp-element-button\" href=\"https:\/\/iss-lab.com\/index.php\/products-technologies\/\" target=\"_blank\" rel=\"noreferrer noopener\"><strong><em>Products &amp; Technologies Page<\/em><\/strong><\/a><\/div>\n\n\n\n<div class=\"wp-block-button has-custom-width wp-block-button__width-25 is-style-outline\"><a class=\"wp-block-button__link wp-element-button\" href=\"https:\/\/iss-lab.com\/\"><strong><em>Home Page<\/em><\/strong><\/a><\/div>\n\n\n\n<div class=\"wp-block-button is-style-outline\"><a class=\"wp-block-button__link wp-element-button\" href=\"https:\/\/iss-lab.com\/index.php\/contact-us\/\" target=\"_blank\" rel=\"noreferrer noopener\"><strong><em>Contact us<\/em><\/strong><\/a><\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>Making Excellence Repeatable Protect and Grow Your Profit with Precision Rate and Thickness Monitoring The SemiQCM\u2122 SR sensor is one component of a system for precursor monitoring with the other components being an IMM-200 and FabGuard (version 19.12.00-a or higher). Semi Process Monitoring can be used in semiconductor applications for end point detection and fault [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_mi_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"footnotes":""},"_links":{"self":[{"href":"https:\/\/iss-lab.com\/index.php\/wp-json\/wp\/v2\/pages\/4637"}],"collection":[{"href":"https:\/\/iss-lab.com\/index.php\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/iss-lab.com\/index.php\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/iss-lab.com\/index.php\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iss-lab.com\/index.php\/wp-json\/wp\/v2\/comments?post=4637"}],"version-history":[{"count":1,"href":"https:\/\/iss-lab.com\/index.php\/wp-json\/wp\/v2\/pages\/4637\/revisions"}],"predecessor-version":[{"id":4640,"href":"https:\/\/iss-lab.com\/index.php\/wp-json\/wp\/v2\/pages\/4637\/revisions\/4640"}],"wp:attachment":[{"href":"https:\/\/iss-lab.com\/index.php\/wp-json\/wp\/v2\/media?parent=4637"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}