Exceeding Detection Limits with Superior Stability and Refined Resolution
Rapid advancements in semiconductor manufacturing technology rely on swift and dependable gas analysis solutions. In the fab or in the lab, select the INFICON QMG 700 Analytical Mass Spectrometer to break through detection barriers and propel your process to the next level of innovation. The QMG 700 provides unparalleled performance and adaptability in a modular design. Enhance your competitive edge with the QMG 700, and achieve a superior level of measurement capability.
Select from a wide range of ion source, mass filter, and RF power supply options, to tailor your QMG 700 to specific applications. The QMG 700 boasts more than nine decades of dynamic range and ppb detection limits, making it the ideal instrument for ultra high vacuum measurements. QMG 700 provides unit resolution across its entire mass range, and even higher resolution for low masses. The instrument is a superb option for the most challenging measurements, including isotope analyses, such as helium and deuterium separation. Control your process with the QMG 700 and rely upon its superior long-term stability to protect critical measurements.
More than forty years of analytical mass spectrometry excellence at INFICON ensure the QMG 700 is the right choice for your next gas analysis investment. For consistent accuracy and precise results, you can rely on the INFICON QMG 700 and our worldwide applications expertise.
Features
- Mass range options from 1-512 amu
- More than nine decades of dynamic range
- Extremely fast measurement speeds: 0.125 ms/amu
- MDPP < 10E-16 mbar
- High resolution across entire mass range: Masses 1, 2, and 3 clearly separable in ppb range
- Multiple different ion source options
- Discrete or continuous dynode electron multiplier options
- IO option: 8 analog inputs/outputs and 32 digital inputs/outputs
- Powerful software with flexible and user friendly interface
Typical Applications
- Gas discharge mass spectrometry
- End point detection
- Deposition material monitoring
- Secondary ion mass spectrometry